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JIS C 2571:1995

Superseded

Superseded

View Superseded by

Test methods of directly heated negative temperature coefficient thermistors

Available format(s)

PDF

Language(s)

English

Published date

11-30-1995

Superseded date

11-20-1998

Superseded by

JIS C 2570:1998

This Japanese Industrial Standard specifies test methods of directly heated negative temperature coefficient thermistors which are mainly used in electronic equipment as heat sensitive elements or circuit components. (hereafter refereed to as \"thermistors\"). If there is any discrepance between the provisions of this Standard and the relevant detail specification, the provision of the detail specification shall be followed.

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Superseded
SupersededBy