JIS C 2571:1995
Superseded
Superseded
View Superseded by
Test methods of directly heated negative temperature coefficient thermistors
Published date
11-30-1995
Publisher
Superseded date
11-20-1998
Superseded by
Sorry this product is not available in your region.
This Japanese Industrial Standard specifies test methods of directly heated negative temperature coefficient thermistors which are mainly used in electronic equipment as heat sensitive elements or circuit components. (hereafter refereed to as \"thermistors\"). If there is any discrepance between the provisions of this Standard and the relevant detail specification, the provision of the detail specification shall be followed.
| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy |
Summarise
Sorry this product is not available in your region.