JIS C 5029:1975
Superseded
Superseded
View Superseded by
Low air pressure testing method for electronic components
Published date
05-01-1975
Publisher
Superseded date
06-19-2025
Superseded by
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This Japanese Industrial Standard specifies testing methods to measure the characteristics of electronic components at reduced pressure, thereby to determine their adaptability for usage at reduced pressure.
| DocumentType |
Standard
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy |
75
Summarise
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