JIS C 5029:1975
Superseded
Superseded
View Superseded by
Low air pressure testing method for electronic components
Available format(s)
PDF
Language(s)
English
Published date
05-01-1975
Publisher
Superseded date
06-19-2025
Superseded by
Excluding Tax where applicable
This Japanese Industrial Standard specifies testing methods to measure the characteristics of electronic components at reduced pressure, thereby to determine their adaptability for usage at reduced pressure.
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy |
75
Summarise