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JIS C 5036:1975

Withdrawn

Withdrawn

Endurance (electrical) testing method for electronic components

Available format(s)

PDF

Language(s)

English

Published date

05-01-1975

Withdrawn date

12-01-1993

This Japanese Industrial Standard specifies the testing methods to examine the effects on electronic components which are electrically operated for many hours under the specified conditions and to determine the adaptability of electronic components in use.

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Withdrawn

75

JIS C 5202:1990 Test methods of fixed resistors for electronic equipment