JIS C 61326-2-1:2022
Current
Current
Electrical equipment for measurement, control and laboratory use -- EMC requirements -- Part 2-1: Particular requirements -- Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications
Published date
08-22-2022
Publisher
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| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 61326-2-1:2020 | Identical |
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