JIS C 6703:2002
Superseded
View Superseded by
Generic specification of crystal filters
English
07-31-2002
12-23-2016
This Standard is the generic specification of crystal filters, and specifies the test methods and general requirements for crystal filters. This is applicable for capability approval and/or qualification approval procedure(s) based on IEC Quality Assessment System for Electronic Components (IECQ).
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| JIS C 60068-2-17:2001 | Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing |
| JIS C 60068-2-52:2000 | Environmental testing -- Part 2: Tests -- Test Kb: Salt mist, cyclic (sodium chloride solution) Part 2: Tests - Test Kb: Salt mist, cyclic (sodium, chloride solution) |
| JIS C 60068-2-21:2002 | Environmental testing -- Part 2-21: Tests -- Test U: Robustness of termination and integral mounting devices Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
| JIS C 6701:2007 | Generic specification of quartz crystal units |
| JIS C 60068-2-13:1989 | Basic environmental testing procedures Part 2: Tests, Test M: Low air pressure Part 2: Tests, Test M: Low air pressure |
| JIS C 60068-2-7:1993 | Basic environmental testing procedures Part 2: Tests -- Test Ga and guidance: Acceleration, steady state |
| JIS C 60068-2-20:1996 | Basic environmental testing procedures Part 2: Tests. Test T: Soldering Part 2: Tests. Test T: Soldering |
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance Part 1: General and guidance |
| JIS C 60068-2-45:1995 | Environmental testing procedures of electronic and electrical resistance to solvents (immersion in cleaning solvents) |
| JIS C 60068-2-64:1997 | Environmental testing Part 2: Test methods -- Test Fh: Vibration, broad-band random (digital control) and guidance Part 2: Test methods - Test Fh: Vibration, broad-band random (digital control) and guidance |
| JIS C 60068-2-32:1995 | Environmental testing Part 2: Tests. Test Ed: Free fall Part 2: Tests. Test Ed: Free fall |
| JIS C 60068-2-58:2006 | Environmental testing -- Part 2: Tests -- Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
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