JIS C 7021:1977
Withdrawn
Environmental testing methods and endurance testing methods for discrete semiconductor devices
English
05-31-1977
06-20-1997
This Japanese Industrial Standard specifies the environmental testing methods and endurance testing methods to evaluate the stability of performance of discrete semiconductor devices (except integrated circuits) under several environmental conditions during the use, transport and storage.
| DocumentType |
Standard
|
| Pages |
74
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
77
| JIS C 5942:1997 | General rules of laser diodes used for recording and playback |
| JIS C 6112:1996 | General rules of transmitting and/or receiving modules for middle and high speed fiber optic transmission |
| JIS C 7032:1993 | General rules for transistors |
| JIS C 5941:1997 | Measuring methods of laser diodes for fiber optic transmission |
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