JIS C 7022:1979
Withdrawn
Environmental testing methods and endurance testing methods for semiconductor integrated circuits
English
05-31-1979
09-20-1997
This Japanese Industrial Standard specifies the environmental testing methods and endurance testing methods to evaluate the durability of integrated circuits (except hybrid integrated circuits) used mainly for the industrial and commercial electronic equipments under various environmental conditions which the integrated circuit may encounter in the use, storage and transport.
| DocumentType |
Standard
|
| Pages |
52
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
79
| JIS X 6305:1995 | Identification cards -- Test methods |
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