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JIS K 0132:1997

JIS K 0132:1997

Current

Current

The latest, up-to-date edition.

General rules for scanning electron microscopy

Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

10-01-1997

Publisher

Japanese Standards Association

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This Japanese Industrial Standard specifies general matters which are needed when the morphological observation and analysis of micro spot on specimen surface are carried out mainly owing to the secondary electrons using a scanning electron microscope.

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Current

Reaffirmed 2016

JIS K 0050:2005 General rules for chemical analysis

JIS K 0215:2005 Technical terms for analytical chemistry (analytical instrument part)
JIS H 7803:2005 General rules for the determination of particle size and crystallite size in metal catalysts
JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope

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Hardcopy - Japanese
Hardcopy - English
PDF - English
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