JIS Z 2320-3:2007
Withdrawn
View Superseded by
Non-destructive testing -- Magnetic particle testing -- Part 3: Equipment Part 3: Equipment
English
01-20-2007
10-23-2025
This part of JIS Z 2320 specifies magnetizing equipment, demagnetizing equipment, illumination equipment, and metering and monitoring equipment which compose three types of equipment (portable electromagnets, fixed installation magnetic benches, specialized testing systems) for magnetic particle testing.
| DocumentType |
Standard
|
| Pages |
17
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
Reaffirmed 2011
| JIS Z 2321:1993 | AC yoke magnet for magnetic particle testing |
| JIS Z 2300:2003 | Terms and definitions of nondestructive testing |
| JIS G 4051:2005 | Carbon steels for machine structural use |
| JIS Z 8703:1983 | Standard atmospheric conditions for testing |
| JIS C 0920:2003 | Degrees of protection provided by enclosures (IP Code) |
| JIS Z 2320-1:2007 | Non-destructive testing -- Magnetic particle testing -- Part 1: General principles Part 1: General principles |
| JIS Z 2323:2005 | Non-destructive testing -- Penetrant testing and magnetic particle testing -- Viewing conditions |
| JIS Z 2320-1:2007 | Non-destructive testing -- Magnetic particle testing -- Part 1: General principles Part 1: General principles |
| JIS Z 2320-2:2007 | Non-destructive testing -- Magnetic particle testing -- Part 2: Detection media Part 2: Detection media |
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