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JIS Z 4504:2008

Withdrawn

Withdrawn

View Superseded by

Evaluation of surface contamination -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

Published date

01-20-2008

Withdrawn date

04-30-2025

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DocumentType
Standard
ProductNote
Japanese PDF version unavailable from Intertek Inform.
PublisherName
Japanese Standards Association
Status
Withdrawn
SupersededBy
Supersedes

Standards Relationship
ISO 7503-1:1988 Identical

2008(R2012) [22/10/2012]2008 [20/01/2008]93(R1999) [20/06/1999]93 [01/10/1993]75 [01/01/1975]

JIS Z 4001:1999 Glossary of terms used in nuclear energy
JIS Z 4329:2004 Portable radiation surface contamination meters and monitors
JIS Z 4334:2005 Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

JIS Z 4334:2005 Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

Sorry this product is not available in your region.