MIL-PRF-19500-241 Revision R:2015
Current
Semiconductor Device, Diode, Silicon, Low Leakage, Controlled Forward Voltage, Types 1N3595, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
English
01-30-2015
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for silicon, controlled forward voltage diodes.
| DevelopmentNote |
Supersedes MIL S 19500/241 (F). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for silicon, controlled forward voltage diodes. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance (JANHC and JANKC) are provided for unencapsulated devices.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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