MIL-PRF-19500-295 Revision F:2012
Superseded
View Superseded by
Transistor, Field-Effect, P-Channel, Silicon, Through-Hole and Surface Mount Packages, Type 2N2608, Quality Level JAN
English
02-15-2012
02-05-2020
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for P-channel, junction, silicon field-effect transistors.
| DevelopmentNote |
Supersedes MIL S 19500/295 (B). Inactive for new design. (09/2001)
|
| DocumentType |
Standard
|
| Pages |
11
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
This specification covers the performance requirements for P-channel, junction, silicon field-effect transistors. One level of product assurance (JAN) is provided for each device type as specified in MIL-PRF-19500.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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