MIL-PRF-19500-445 Revision D:1999
Superseded
View Superseded by
Semiconductor Device, Diode, Silicon, Switching Types 1N5712, 1N5712-1 and 1N5712UR-1, JAN, JANTX, JANTXV, JANJ, JANS, JANHC AND JANKC (S/S by MIL-PRF-19500/444)
06-18-1999
02-15-2006
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Gives performance requirements for Schottky barrier diodes. Five levels of product assurance are given for each type of device defined in MIL-PRF-19500. Two levels of product assurance are given for each unencapsulated device.
| DevelopmentNote |
SUPERSEDES MIL S 19500/445 (C). (02/2000) D NOTICE 1 - Notice of Inactivation for New Design. (03/2002) D NOTICE 2 - Notice of Cancellation/Superseded by MIL PRF 19500/444. (03/2006)
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| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
This specification covers the performance requirements for Schottky barrier diodes. Five levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two level of product assurance are provided for each unencapsulated device type.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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