MIL-PRF-19500-538 Revision G:2013
Superseded
View Superseded by
Transistor, NPN, Silicon, Power, Enncapsulated (Through-Hole Packages) and Un-Encapsulated (Die), Types 2N6676, 2N6678, 2N6691,and 2N6693, JAN, JANTX, JANTXV, JANS, JANHC,and JANKC
English
12-13-2013
04-24-2021
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for NPN silicon, power transistors.
| DevelopmentNote |
Supersedes MIL S 19500/538. (02/2000)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
This specification covers the performance requirements for NPN silicon, power transistors. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each device type. Two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA) to eight radiation levels is provided for JANS and JANKC product assurance levels. RHA level designators “M”, “D”, “P“, “L”, “R”, “F”, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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