MIL-PRF-19500-559 Revision L:2015
Superseded
View Superseded by
Semiconductor Device, Unitized, NPN, Silicon, Switching, Four Transistor Array, Types 2N6989, and 2N6990, JAN, JANTX, JANTXV, JANS
English
07-30-2015
01-25-2021
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for NPN, silicon, switching transistors in a four independent chip array.
| DevelopmentNote |
Supersedes MIL S 19500/559 (B). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
33
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
This specification covers the performance requirements for NPN, silicon, switching transistors in a four independent chip array. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Provisions for radiation hardness assurance (RHA) to eight radiation levels is provided for JANS product assurance levels. RHA level designators “M”, “D”, “P“, “L”, “R”, “F’, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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