MIL-PRF-19500-746 Revision C:2014
Superseded
View Superseded by
Transistor, Field Effect, Radiation Hardened, N-Channel, Silicon, Surface Mount and Un-Encapsulated, Types 2N7587, 2N7589, 2N7591, and 2N7593, Quality Levels JANTXV, JANS, JANHC, and JANKC
11-17-2014
01-06-2022
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for a N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor.
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
This specification covers the performance requirements for a N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor. Two levels of product assurance (JANTXV and JANS) are provided for each encapsulated device. Two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device. Three levels (R, F and G) of radiation hardness assurance (RHA) are provided for product assurance levels JANTXV, JANS, JANHC, and JANKC.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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