MIL S 19500/225 : E
Superseded
View Superseded by
SEMICONDUCTOR DEVICE, TRANSISTOR, NPN SILICON TYPES 2N1711, TX2N1711, 2N1890 AND TX 2N1890
English
06-25-1999
Details requirements for such transistors. The prefix "TX" refers to devices submitted to and passing the special process-conditioning, testing, and screening specified herein.
| Committee |
FSC 5961
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-202 Revision H:2015 | Electronic and Electrical Component Parts |
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