MIL S 19500/231 : F
Superseded
Superseded
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SEMICONDUCTOR DEVICE, DIODE, SILICON, SWITCHING TYPES 1N3600, 1N4150 TX1N3600 AND TX1N4150
Published date
01-12-2013
Publisher
Superseded date
03-28-1997
Superseded by
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Details requirements for silicon, switching diodes. Four levels of product assurance are provided for each device type as specified in MIL-S-19500.
| Committee |
FSC 5961
|
| DocumentType |
Standard
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
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