MIL S 19500/522 : 0
Superseded
View Superseded by
SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH-FREQUENCY DEVICE TYPES - JAN 2N6603 & TXV 2N6603, JAN 2N6604 & TXV 2N6604
English
07-30-1999
Specifies NPN, silicon, Microwave transistors. "JAN" used on devices passing Precap Visual and Bond Strength testing. "TXV" used on devices passing specified inspection
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-202 Revision H:2015 | Electronic and Electrical Component Parts |
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