MIL-STD-750/3:2012/CHANGE 1:2019
Current
Transistor Electrical Test Methods for Semiconductor Devices Part 3: Test Methods 3000 Through 3999
English
12-09-2019
Part 3 of this test method standard establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Test Method
|
| Pages |
345
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
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