MIL-STD-750-4 Change 3 (all previous changes incorporated):2019
Current
Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 Through 4999
English
12-30-2019
| CommentClosesDate |
06-22-2020
|
| DocumentType |
Standard
|
| Pages |
354
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts.
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