MIL-STD-883-2 Base Document:2019
Superseded
View Superseded by
Mechanical Test Methods for Microcircuits Part 2: Test Methods 2000-2999
English
09-16-2019
05-19-2022
Part 2 of this test method standard establishes uniform test methods for the mechanical testing to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Standard
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| Pages |
385
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| ProductNote |
THIS STANDARD ALSO REFERS TO SAE AMS-STD-595/15102,SAE AMS-STD-595/25102 ,JEDEC Standard 12,JEDEC Standard 12-1,JEDEC Standard 12-2,JEDEC Standard 12-3
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| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Superseded
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| SupersededBy |
Part 2 of this test method standard establishes uniform test methods for the mechanical testing to
determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
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