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MIL-STD-883-5 Base Document:2019

MIL-STD-883-5 Base Document:2019

Current

Current

The latest, up-to-date edition.

Test Procedures for Microcircuits Part 5: Test Methods 5000-5999

Available format(s)

PDF

Language(s)

English

Published date

09-16-2019

Publisher

US Military Specs/Standards/Handbooks

Part 5 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.

DocumentType
Test Method
Pages
0
ProductNote
THIS STANDARD IS ALSO REFER TO: SAE AMS-STD 595/15102, SAE AMS STD 595/25102, ANSI Z 5403, JEDEC STANDARD12, JEDEC STANDARD 12-1, JEDEC STANDARD 12-2, JEDEC STANDARD 12-3
PublisherName
US Military Specs/Standards/Handbooks
Status
Current

Standards Relationship
DSCC89844H:2023 Identical

DSCC 09220C:2022 MICROCIRCUIT, LINEAR, DIFFERENTIAL ANALOG-TO-DIGITAL CONVERTER DRIVER, LOW DISTORTION, MONOLITHIC SILICON

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PDF - English
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