MIL-STD-977 Base Document:1982
Withdrawn
TEST METHODS AND PROCEDURES FOR MICROCIRCUIT LINE CERTIFICATION (NO S/S DOCUMENT)
01-25-1982
11-15-1994
Measures for control of materials and processes used in manufacture of microcircuits as applicable to silicon wafer fabrication only.
| DocumentType |
Standard
|
| Pages |
111
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Withdrawn
|
This standard sets forth test methods are procedures applicable to the control of materials and processes used in the manufacture of microcircuits.
| MIL H 38534 : B (1) | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| MIL-STD-976 Revision B:1988 | CERTIFICATION REQUIREMENTS FOR JAN MICROCIRCUITS (NO S/S DOCUMENT) |
| MIL R 28750 : C SUPP 1 | RELAYS, SOLID STATE, SEALED, OPTICALLY ISOLATED, ZERO VOLTAGE TURN ON, 25 AMPERES, 250 VOLTS MAXIMUM, 45-440 HZ, POWER SWITCHING |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-STD-45662 Revision A:1988 | Calibration Systems Requirements (Refer to ISO-10012-1 and ANSI-Z540-1 or Comparable Standards as Alternatives to MIL-STD-45662) |
| MIL-M-38510 Revision J:1991 | Microcircuits, General Specification for |
| FED-STD-209 Revision E:1992 | Airborne Particulate Cleanliness Classes in Cleanrooms and Clean Zones (S/S by ISO14644-1 and ISO14644-2) |
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