NEMA CB 4 : 1989
Withdrawn
Withdrawn
SEMICONDUCTOR GRAPHITE
Published date
01-12-2013
Withdrawn date
04-12-2000
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Foreword
Scope
1 Referenced standards and definitions
Referenced standards
Definitions
2 Graphite properties
Classification of grain size
Classification of purity
Procedures for material testing
3 General
Handling of purified graphite
Dust removal
Outgassing
Oxidation
Purification
Defines those physical and chemical properties that are relevant to the material characterization of graphites used in the semiconductor industry. Does not incorporate any application performance standards relative to semiconductor graphites.
| DocumentType |
Standard
|
| PublisherName |
National Electrical Manufacturers Association
|
| Status |
Withdrawn
|
| ASTM E 228 : 2017 : REDLINE | Standard Test Method for Linear Thermal Expansion of Solid Materials With a Push-Rod Dilatometer |
| NEMA CB 1:2000 (R2012) | Brushes for Electrical Machines |
| ASTM C 561 : 2016 : REDLINE | Standard Test Method for Ash in a Graphite Sample |
| ASTM C 559 : 2016 : REDLINE | Standard Test Method for Bulk Density by Physical Measurements of Manufactured Carbon and Graphite Articles |
Summarise
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