NEN 10747-10 : 1997 AMD 3 1997
Current
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The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 10: GENERIC SPECIFICATIONS FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
Published date
01-12-2013
Publisher
Defines general procedures for quality assessment to be used in the IEQO System and gives general rules for: measurement methods of electrical characteristics; climatic and mechanical tests; endurance tests.
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