NEN 11580 : 1995
Current
Current
MEASUREMENT OF RETURN LOSS ON WAVEGUIDE AND WAVEGUIDE ASSEMBLIES
Published date
01-12-2013
Publisher
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Summarise this standard
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Relates with the sweep frequency method used for the measurement of return loss on waveguide and waveguide assemblies. Fundamentally the method involves measuring the amplitude of the reflected wave at the waveguide under test (WUT) input by means of a reflectometer device.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61580:1995 | Identical |
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