NEN EN IEC 60444-8 : 2017
Current
Current
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
Published date
01-12-2013
Publisher
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Describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts).
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 60444-8:2017 | Identical |
| IEC 60444-8:2016 | Identical |
Summarise
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