NEN EN IEC 60749-18 : 2003
Withdrawn
Withdrawn
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONISING RADIATION (TOTAL DOSE)
Published date
01-12-2013
Publisher
Withdrawn date
06-01-2019
Superseded by
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Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| IEC 60749-18:2002 | Identical |
| EN 60749-18:2003 | Identical |
Summarise
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