NEN-EN-IEC 60749-41:2020
Current
Current
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Published date
09-01-2020
Publisher
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NEN-EN-IEC 60749-41 specifies the procedural requirements for performing valid endurance,retention and cross-temperature tests based on a qualification specification.
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-41:2020 | Identical |
| EN IEC 60749-41:2020 | Identical |
Summarise
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