NEN EN IEC 61326-2-1 : 2013
Withdrawn
Withdrawn
View Superseded by
Published date
01-12-2013
Publisher
Withdrawn date
06-01-2021
Superseded by
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Defines more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer.
| DevelopmentNote |
Supersedes NEN EN IEC 61326. (06/2006)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| EN 61326-2-1:2013 | Identical |
| IEC 61326-2-1:2012 | Identical |
Summarise
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