NEN EN IEC 61926-1 : 2000
Current
Current
DESIGN AUTOMATION - PART 1: STANDARD TEST LANGUAGE FOR ALL SYSTEMS - COMMON ABBREVIATED TEST LANGUAGE FOR ALL SYSTEMS (C/ATLAS)
Published date
01-12-2013
Publisher
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Describes a high order language for electronics testing independent of any specific test system. Can be implemented on automatic test equipment (ATE).
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 61926-1:2000 | Identical |
| IEC 61926-1:1999 | Identical |
Summarise
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