NEN EN IEC 62415 : 2010
Current
Current
SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
Published date
01-12-2013
Publisher
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Specifies a method for conventional constant current electromigration testing of metal lines, via string and contacts.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62415:2010 | Identical |
| EN 62415:2010 | Identical |
Summarise
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