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NEN EN IEC 62779-2 : 2016

Current

Current

SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR HUMAN BODY COMMUNICATION - PART 2: CHARACTERIZATION OF INTERFACING PERFORMANCES

Published date

07-12-2016

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Specifies a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC).

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
EN 62779-2:2016 Identical
IEC 62779-2:2016 Identical

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