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NEN IEC 60747-9 : 2007

Withdrawn

Withdrawn

View Superseded by

SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 9: INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS)

Published date

01-12-2013

Withdrawn date

11-01-2019

Superseded by

NEN-IEC 60747-9:2019

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Provides product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Withdrawn
SupersededBy

Standards Relationship
IEC 60747-9:2007 Identical

Sorry this product is not available in your region.