NEN IEC 60748-11 : 2000 AMD 2 2000
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 11: SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
Published date
01-12-2013
Publisher
Defines inspection and sampling requirements, screening sequences, test and measurement methods in order to assess integrated circuits.
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