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NEN IEC 61445 : 2012

Current

Current

The latest, up-to-date edition.

DIGITAL TEST INTERCHANGE FORMAT (DTIF)

Published date

01-12-2013

Specifies the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
IEC 61445:2012 Identical

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