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NEN IEC 62528 : 2007

Current

Current

STANDARD TESTABILITY METHOD FOR EMBEDDED CORE-BASED INTEGRATED CIRCUITS

Published date

01-12-2013

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Defines a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
IEC 62528:2007 Identical
IEEE 1500:2007 Identical

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