NEN-ISO 23420:2021
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Microbeam analysis - Analytical electron microscopy - Method for the determination of energy resolution for electron energy loss spectrum analysis
Available format(s)
Hardcopy
Language(s)
English
Published date
05-01-2021
Publisher
NEN-ISO 23420 specifies a determination procedure of energy resolution in the scanning transmission electron microscope or the transmission electron microscope equipped with the electron energy loss (EEL) spectrometer.
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