NEN ISO 24173 : 2009
Superseded
Superseded
View Superseded by
MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION
Published date
01-12-2013
Publisher
Superseded date
11-13-2025
Superseded by
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Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It also addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| ISO 24173:2009 | Identical |
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