NEN ISO 24237 : 2005
Current
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SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - REPEATABILITY AND CONSTANCY OF INTENSITY SCALE
Published date
01-12-2013
Publisher
Defines a method for evaluating the repeatability and constancy of the intensity scale of X-ray photoelectron spectrometers, for general analytical purposes, using unmonochromated Al or Mg X-rays or monochromated Al X-rays.
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