NEN ISO 29301 : 2018
Current
Current
MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - METHODS FOR CALIBRATING IMAGE MAGNIFICATION BY USING REFERENCE MATERIALS WITH PERIODIC STRUCTURES
Published date
10-31-2018
Publisher
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Defines a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM).
| Committee |
TC 202
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 29301:2010 | Identical |
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