NS EN ISO 12179 : 2000 AC 2008

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Conditions of use
5 Measurement standards
6 Contact (stylus) instrument metrological
      characteristics
7 Calibration
8 Uncertainty of measurement
9 Contact (stylus) instrument calibration certificate
Annex A (normative) Calibration of instruments measuring
                    the motifs method parameters
Annex B (normative) Calibration of simplified operator
                    instruments for the measurement of
                    surface texture
Annex C (informative) Relation to the GPS matrix model
Bibliography

Applicable to the calibration of the metrological characteristics of contact (stylus) instruments for measuring surface texture using the profile procedure as specified in ISO 3274.