PD ES 59008-2:1999
Withdrawn
Withdrawn
View Superseded by
Data requirements for semiconductor die Vocabulary
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
12-15-1999
Publisher
Withdrawn date
10-26-2018
Superseded by
US$341.23
Excluding Tax where applicable
Specifies vocabulary requirements for the exchange of data pertaining to bare semiconductor die, with or without connection structures, and minimally-packaged semiconductor die.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| ES 59008-2 : 1999 | Identical |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ISO/IEC 11179-3:2013 | Information technology — Metadata registries (MDR) — Part 3: Registry metamodel and basic attributes |
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| EIA 554 : 1996 | METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM) |
| MIL-PRF-38534 Revision J:2015 | Hybrid Microcircuits, General Specification for |
| IEEE 1364-2005 | IEEE Standard for Verilog Hardware Description Language |
| FED-STD-209 Revision E:1992 | Airborne Particulate Cleanliness Classes in Cleanrooms and Clean Zones (S/S by ISO14644-1 and ISO14644-2) |
| IEC 61360-1:2017 | Standard data element types with associated classification scheme - Part 1: Definitions - Principles and methods |
| IEEE 1076-2008 REDLINE | IEEE Standard VHDL Language Reference Manual |
| ES 59008-1 : 1999 | DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 1 - GENERAL REQUIREMENTS |
| ISO 8879:1986 | Information processing — Text and office systems — Standard Generalized Markup Language (SGML) |
| ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
Summarise
US$341.23
Excluding Tax where applicable