PN-EN 15991:2026-02
Current
Current
Analysis of Ceramic Raw Materials and Materials -- Direct determination of impurities, expressed in mass fractions, in silicon carbide powders and granules by optical emission spectrometry with inductively coupled plasma with electrochemical evaporation (ETV-ICP-OES)
Published date
02-20-2026
Publisher
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| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 15991:2025 | Identical |
Summarise
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