PN EN 60749-32 : 2005 AMD 1 2010
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
Published date
01-12-2013
Publisher
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Summarise this standard
AI-generated summary
| Committee |
TC 60
|
| DevelopmentNote |
AMD 1 2010 is only available in English. (12/2010)
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-32:2002+AMD1:2010 CSV | Identical |
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