PN EN 60749-37 : 2008
Superseded
Superseded
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER
Published date
01-12-2013
Publisher
Superseded date
07-22-2023
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| Committee |
TC 292
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Superseded
|
| Standards | Relationship |
| EN 60749-37:2008 | Identical |
| IEC 60749-37:2008 | Identical |
Summarise
Sorry this product is not available in your region.