SAC GB/T 4937.38:2025
Current
Current
Semiconductor Device Mechanical and Climate Testing Methods Part 38: Soft Fault Testing Methods for Semiconductor Devices with Storage
Available format(s)
Hardcopy
Language(s)
English
Published date
12-02-2025
Publisher
US$470.40
Excluding Tax where applicable
Summarise this standard
AI-generated summary
| DocumentType |
Test Method
|
| Pages |
724
|
| PublisherName |
Standardization Administration of China
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-38:2008 | Identical |
US$470.40
Excluding Tax where applicable
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