SAC GB/T 4937-4 : 2012
Current
Current
Semiconductor Device Mechanical and Climate Testing Methods Part 4: Strong Accelerated Steady-State Damp Heat Test (HAST)
Available format(s)
Hardcopy
Language(s)
English
Published date
03-25-2013
Publisher
Excluding Tax where applicable
Summarise this standard
AI-generated summary
| DocumentType |
Test Method
|
| Pages |
764
|
| PublisherName |
Standardization Administration of China
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-4:2017 | Identical |