SS-EN IEC 60749-37, UTG 2:2023
Current
Current
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Published date
02-22-2023
Publisher
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| DocumentType |
Test Method
|
| PublisherName |
Standardiserings-Kommissionen I Sverige
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 60749-37:2022 | Identical |
| IEC 60749-37:2022 | Identical |
Summarise
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